1. Integrated circuit defect-sensitivity : theory and computational models

پدیدآورنده :

کتابخانه: کتابخانه مرکزی پردیس 1 فنی دانشگاه تهران (طهران)

موضوع : Integrated circuits - Very large scale integration - Design and construction - Data processing,Integrated circuits - Very large scale integration - Defects - Mathematical models,Computer-aided design

رده :
TK
7874
.
P53
1993

2. Simulated annealing for VLSI design

پدیدآورنده :

کتابخانه: کتابخانه مرکزی و مرکز اطلاع رسانی دانشگاه فردوسی مشهد (خراسان رضوی)

موضوع : Very large scale integration - Design and construction - Data processing ، Integrated circuits,Mathematical models ، Annealing of metals

رده :
TK
7874
.
W65
1988

3. Statistical modeling for computer-aided design of MOS VLSI circuits

پدیدآورنده :

موضوع : Metal oxide semiconductors - Design and construction - Statistical methods - Data processing,Metal oxide semiconductors - Mathematical models,Integrated circuits - Very large scale integration - Design and construction - Data processing,Integrated circuits - Very large scale integration - Mathematical models,Computer-aided design

۲ نسخه از این کتاب در ۲ کتابخانه موجود است.

4. Yield simulation for integrated circuits

پدیدآورنده :

کتابخانه: كتابخانه پژوهشگاه نیرو (طهران)

موضوع : ، Integrated circuits- Very large scale integration- Design and construction- Mathematical models,، Integrated circuits- Very large scale integration- Design and construction- Data processing,، Integrated circuits- Very large scale integration- Defects- Mathematical models,، Integrated circuits- Very large scale integration- Defects- Data processing,، Monte Carlo method